Bea2008a – Jean-Marie Beaulieu

[Bea2008a]
Classification of Polarimetric SAR Images using Radiometric and Texture Information

Authors:Beaulieu Jean-Marie, Ridha Touzi

Conference:IEEE International Geoscience and Remote Sensing Symposium IGARSS 2008

Boston, MA, USA

July 7-11, 2008, vol. IV, pp. 29-32

Publisher:IEEE

ISBN:978-1-4244-2807-6

URL:https://ieeexplore.ieee.org/document/4779648

DOI:10.1109/IGARSS.2008.4779648

Classification of Polarimetric SAR Images using Radiometric and Texture Information,
Beaulieu Jean-Marie, Ridha Touzi,
IEEE International Geoscience and Remote Sensing Symposium IGARSS 2008, Boston, MA, USA, July 7-11, 2008, pp. 29-32.
[Bibtex]

@Conference{Bea2008a,
author = {Beaulieu, Jean-Marie and Touzi, Ridha},
editor = {},
title = {Classification of Polarimetric {SAR} Images using Radiometric and Texture Information},
booktitle = {IEEE International Geoscience and Remote Sensing Symposium IGARSS 2008},
volume = {IV},
publisher = {IEEE},
url = {https://ieeexplore.ieee.org/document/4779648},
isbn = {978-1-4244-2807-6},
doi = {10.1109/IGARSS.2008.4779648},
address = {Boston, MA, USA},
pages = {29-32},
year = {2008},
month = {July 7-11},
abstract = {},
mypdf = {11},
slide = {https://BeaulieuJM.ca/slide/slideBea2008a.pdf},
keywords = {classification; classification map; clustering; Clustering algorithms; clustering process; Covariance matrix; geophysical techniques; hierarchical clustering; hierarchical segmentation; image classification; image segmentation; Iterative algorithms; K distribution; mean shift clustering; mean-shift; Merging; Partitioning algorithms; pattern clustering; Pixel; polarimetric SAR image; Probability; radar polarimetry; radiometry; Remote sensing; remote sensing by radar; scalar texture component; synthetic aperture radar; texture; texture information; Wishart distribution}
}

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Published in: IEEE International Geoscience and Remote Sensing Symposium (IGARSS), 2008
Date of Conference: 7-11 July 2008
Date Added to IEEE Xplore: 10 February 2009
INSPEC Accession Number: 10472566
Conference Location: Boston, MA, USA
Publisher: IEEE